Title: Characteristics of strong ferromagnetic Josephson junctions with epitaxial barriers
Authors: Bell, Chris
Loloee, R
Burnell, Gavin
Blamire, Mark G
Keywords: Ferromagnetism
Josephson Junctions
Issue Date: 2005
Series/Report no.: cond-mat;0502537
Abstract: We present the measurement of superconductor / ferromagnetic Josephson junctions, based on an epitaxial Nb bottom electrode and epitaxial Fe20Ni80 barrier. Uniform junctions have been fabricated with a barrier thicknesses in the range 2-12 nm. The maximum critical current density ~ 2.4 \pm 0.2 * 10^9 Am^-2 was found for a devices with a 3 nm thick barrier at 4.2 K, corresponding to an average characteristic voltage I_C R_N ~ 16 \muV. The I_C R_N showed a non-monotonic behavior with Fe20Ni80 thickness. The variation of the resistance of a unit area AR_N, of the junctions with barrier thickness gave a Nb/Py specific interface resistance of 6.0 \pm 0.5 f\Omega m^2 and Fe20Ni80 resistivity of 174 \pm 50 n\Omega m, consistent with other studies in polycrystalline samples.
URI: http://www.dspace.cam.ac.uk/handle/1810/34603
Appears in Collections:Preprints - Device Materials Group

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