| Title: | Critical currents in vicinal YBa2Cu3O7-delta films |
| Authors: | Durrell, John H |
| Keywords: | Superconductivity Critical Currents YBCO |
| Issue Date: | 2004 |
| Citation: | PHYSICAL REVIEW B 70, 214508 (2004) |
| Abstract: | Most measurements of critical current densities in YBa$_2$Cu$_3$O$_{7-\delta}$ thin films to date have been performed on films where the \textit{c}-axis is grown normal to the film surface. With such films, the analysis of the dependence of $j_c$ on the magnetic field angle is complex. The effects of extrinsic contributions to the angular field dependence of $j_c$, such as the measurement geometry and disposition of pinning centres, are convoluted with those intrinsically due to the anisotropy of the material. As a consequence of this, it is difficult to distinguish between proposed FLL structure models on the basis of angular critical current density measurements on \textit{c}-axis films. Films grown on mis-cut (vicinal) substrates have a reduced measurement symmetry and thus provide a greater insight into the critical current anisotropy. In this paper previous descriptions of the magnetic field angle dependence of $j_c$ in YBa$_2$Cu$_3$O$_{7-\delta}$ are reviewed. Measurements on YBa$_2$Cu$_3$O$_{7-\delta}$ thin films grown on a range of vicinal substrates are presented and the results interpreted in terms of the structure and dimensionality of the FLL in YBa$_2$Cu$_3$O$_{7-\delta}$. There is strong evidence for a transition in the structure of the flux line lattice depending on magnetic field magnitude, orientation and temperature. As a consequence, a simple scaling law can not, by itself, describe the observed critical current anisotropy in YBa$_2$Cu$_3$O$_{7-\delta}$. The experimentally obtained $j_c(\theta)$ behaviour of YBCO is successfully described in terms of a kinked vortex structure for fields applied near parallel to the \textit{a-b} planes. |
| Description: | cond-mat/0406620 |
| URI: | http://www.dspace.cam.ac.uk/handle/1810/34592 |
| Appears in Collections: | Preprints - Device Materials Group |
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